Admittivity imaging from multi-frequency micro-electrical impedance tomography

Habib Ammari, Laure Giovangigli, Loc Hoang Nguyen and 
Jin-Keun Seo
may, 2017
Type de publication :
Article (revues avec comité de lecture)
Journal :
Journal of Mathematical Analysis and Applications, vol. 449 (2), pp. 1601-1618
Editeur :
Elsevier
HAL :
hal-02352559
BibTeX :
@article{Amm-Gio-Ngu-Seo-2017,
    author={Habib Ammari and Laure Giovangigli and Loc Hoang Nguyen and 
           Jin-Keun Seo },
    title={Admittivity imaging from multi-frequency micro-electrical 
           impedance tomography },
    doi={10.1016/j.jmaa.2017.01.004 },
    journal={Journal of Mathematical Analysis and Applications },
    year={2017 },
    month={5},
    volume={449 (2) },
    pages={1601--1618},
}