Admittivity imaging from multi-frequency micro-electrical impedance tomography
may, 2017
Type de publication :
Article (revues avec comité de lecture)
Journal :
Journal of Mathematical Analysis and Applications, vol. 449 (2), pp. 1601-1618
Editeur :
Elsevier
HAL :
BibTeX :
@article{Amm-Gio-Ngu-Seo-2017, author={Habib Ammari and Laure Giovangigli and Loc Hoang Nguyen and Jin-Keun Seo }, title={Admittivity imaging from multi-frequency micro-electrical impedance tomography }, doi={10.1016/j.jmaa.2017.01.004 }, journal={Journal of Mathematical Analysis and Applications }, year={2017 }, month={5}, volume={449 (2) }, pages={1601--1618}, }