Admittivity imaging from multi-frequency micro-electrical impedance tomography
may, 2017
Publication type:
Paper in peer-reviewed journals
Journal:
Journal of Mathematical Analysis and Applications, vol. 449 (2), pp. 1601-1618
Publisher:
Elsevier
HAL:
BibTeX:
@article{Amm-Gio-Ngu-Seo-2017, author={Habib Ammari and Laure Giovangigli and Loc Hoang Nguyen and Jin-Keun Seo }, title={Admittivity imaging from multi-frequency micro-electrical impedance tomography }, doi={10.1016/j.jmaa.2017.01.004 }, journal={Journal of Mathematical Analysis and Applications }, year={2017 }, month={5}, volume={449 (2) }, pages={1601--1618}, }